Work
Function Measurements:
The Surface Science
Laboratory at the University
of South Florida offers work function measurements to customers worldwide.
Dr. Schlaf's group has extensive expertise in work function measurements
on a multitude of materials surfaces.
The Surface Science
Laboratory uses the well-established
photoemission spectroscopy based technique, which yields absolute
work function values (in difference to Kelvin probe based techniques,
which only yield a relative contact potential difference between
Kelvin probe and sample surface).
An area of special expertise are work function
measurements on transparent conductive oxides (TCO), such as indium
tin oxide (ITO). Dr. Schlaf's research shows that standard ultraviolet
photoemission spectroscopy (UPS) based work function measurements
on ITO (and many other oxides) are affected by a measurement artifact,
which typically underestimates work function
values by more than 0.5 eV. Adressing this issue, Dr. Schlaf
devised a low-intensity x-ray photoemission spectroscopy (LIXPS)
based technique, which allows to measure accurate values. (for more
information on this unique approach, please, download (PDF): M.
M. Beerbom et al.: Journal of Electron Spectroscopy and Related Phenomena
152 (1-2), pp.12-17 (2006)).
Sample turn-around is usually within one
week. Full characterization of surfaces with core level x-ray photoemission
spectroscopy (XPS) is also available. Dr. Schlaf offers full consulting
services along with measurements, i.e. Dr. Schlaf will generally
be available for discussions of results and planning of experimental
strategies for problem solving/product development. For more information
on collaboration between the Surface Science Lab and industrial partners
can be found
here. Non-disclosure agreements can be
arranged on short notice, if necessary.
Please, contact Dr. Schlaf for discussions
or quotes at schlaf@eng.usf.edu.
Further reading about work function and related topics:
1) Tutorial on work function
2) Tutorial on photoemission spectroscopy vs. work function measurements.
3) Tutorial on Kelvin probe work function measurements.
|
Example (from Beerbom
et al., 2006): Work function
measurement on ITO glass. Bottom: The initial "low intensity x-ray
photoemission spectroscopy" (LIXPS) measurement yields a secondary
electron cutoff corresponding to a work function of 4.5 eV. A subsequent
ultraviolet photoemission spectroscopy (UPS) measurement (second
spectrum) yields a cutoff indicating an reduced work function of
about 3.9 eV. This work function reduction during the UPS measurement
represents a permanent photochemical (UV) modification of the surface.
This is demonstrated by a subsequent LIXPS measurement (3rd spectrum),
confirming the post-UPS work function value of 3.9 eV. Insert: Full
UPS spectrum of ITO surface.
|